1. Test and diagnosis for small-delay defects
پدیدآورنده : / Mohammad Tehranipoor, Ke Peng and Krishnendu Chakrabarty
کتابخانه: Central Library and Document Center of Shahid Chamran University (Khuzestan)
موضوع : Integrated circuits--Very large scale integration--Defects,Integrated circuits--Very large scale integration--Testing,Delay faults (Semiconductors)
رده :
TK
,
7874
,.
T4323
,
2011
2. Test and diagnosis for small-delay defects
پدیدآورنده : / Mohammad Tehranipoor, Ke Peng and Krishnendu Chakrabarty
کتابخانه: University of Tabriz Library, Documentation and Publication Center (East Azarbaijan)
موضوع : Integrated circuits--Very large scale integration--Defects,Integrated circuits--Very large scale integration--Testing,Delay faults (Semiconductors)
رده :
TK7874
.
T4323
2011
