1. Test and diagnosis for small-delay defects
Author: / Mohammad Tehranipoor, Ke Peng and Krishnendu Chakrabarty
Library: Central Library and Document Center of Shahid Chamran University (Khuzestan)
Subject: Integrated circuits--Very large scale integration--Defects,Integrated circuits--Very large scale integration--Testing,Delay faults (Semiconductors)
Classification :
TK
,
7874
,.
T4323
,
2011
2. Test and diagnosis for small-delay defects
Author: / Mohammad Tehranipoor, Ke Peng and Krishnendu Chakrabarty
Library: University of Tabriz Library, Documentation and Publication Center (East Azarbaijan)
Subject: Integrated circuits--Very large scale integration--Defects,Integrated circuits--Very large scale integration--Testing,Delay faults (Semiconductors)
Classification :
TK7874
.
T4323
2011
